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| i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 1 austin semiconductor, inc. 32mx72 ddr2 sdram integrated plastic encapsulated microcircuit features ? ddr2 data rate = 667, 533, 400 ? package: ? 255 plastic ball grid array (pbga), 25 x 32mm ? 1.27mm pitch ? differential data strobe (dqs, dqs#) per byte ? internal, pipelined, double data rate architecture ? 4-bit prefetch architecture ? dll for alignment of dq and dqs transitions with clock signal ? four internal banks for concurrent operation (per ddr2 sdram die) ? programmable burst lengths: 4 or 8 ? auto refresh and self refresh modes ? on die termination (odt) ? adjustable data ? output drive strength ? 1.8v 0.1v power supply and i/o (vcc/vccq) ? programmable cas latency: 3, 4, 5, or 6 ? posted cas additive latency: 0, 1, 2, 3 or 4 ? write latency = read latency - 1* tck ? commercial, industrial and military temperature ranges ? organized as 32m x 72 w/ support for x80 ? weight: as4ddr232m72pbg ~ 3.5 grams typical note: self refresh mode available on industrial and enhanced temp. only benefits ? space conscious pbga defined for easy smt manufacturability (50 mil ball pitch) ? reduced part count ? 47% i/o reduction vs individual csp approach ? reduced trace lengths for lower parasitic capacitance ? suitable for hi-reliability applications ? upgradable to 64m x 72 density (consult factory for info on as4ddr264m72pbg) note: this product is under development, austin semiconductor reserves the right to make changes to the products definition and or specifications with appropriate notice. functional block diagram odt vref vcc vccq vss vssq vccl vssdl vccl vssdl vccl vssdl vccl vssdl vccl vssdl cs0\ cs1\ cs2\ cs3\ cs4\ ax, ba0-1 udmx, ldmx udsqx,udsqx\ ldsqx, ldsqx\ 3 2 2 2 3 2 2 2 3 2 2 2 3 2 2 2 3 2 2 2 rasx\,casx\,wex\ ckx,ckx\,ckex 3 3 3 3 3 a bcd dq0-15 dq16-31 dq32-47 dq48-63 a b c d dq64-79
i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 2 austin semiconductor, inc. sdram-ddrii pinout top view rev. a, 07/06 - x72/x80 p rev. b, 10/06 - x72/x80 12345678910111213141516 a dq0 dq14 dq15 vss vss a9 a10 a11 a8 vccq vccq dq16 dq17 dq31 vss a b dq1 dq2 dq12 dq13 vss vss a0 a7 a6 a1 vcc vcc dq18 dq19 dq29 dq30 b c dq3 dq4 dq10 dq11 vcc vcc a2 a5 a4 a3 vss vss dq20 dq21 dq27 dq28 c d dq6 dq5 dq8 dq9 vccq vccq a12/nc dnu dnu dnu vss vss dq22 dq23 dq26 dq25 d e dq7 ldm0 vcc udm0 udqs3 ldqs0 udqs0 ba0 ba1 ldqs1 udqs1 vref ldm1 vss nc dq24 e f cas0\ we0\ vcc clk0 ldqs3 udqs3\ ldqs0\ udqs0\ nc udqs1\ ldqs1\ ras1\ we1\ vss udm1 clk1 f g cs0\ ras0\ vcc cke0 clk0\ ldqs3\ vssq vssq vssq vssq nc cas1\ cs1\ vss clk1\ cke1 g h vss vss vcc vccq vss nc vssq vssq vssq vssq nc vcc vss vss vccq vcc h j vss vss vcc vccq vss nc vssq vssq vssq vssq nc vcc vss vss vccq vcc j k clk3\ cke3 vcc cs3\ ldqs4 udqs4\ vssq vssq vssq vssq nc clk2\ cke2 vss ras2\ cs2\ k l nc clk3 vcc cas3\ ras3\ odt ldqs4\ nc nc ldqs2\ udqs2\ ldqs2 clk2 vss we2\ cas2\ l m dq56 udm3 vcc we3\ ldm3 cke4 udm4 clk4 cas4\ we4\ ras4\ cs4\ udm2 vss ldm2 dq39 m n dq57 dq58 dq55 dq54 udqs4 clk4\ dq73 dq72 dq71 dq70 ldm4 udqs2 dq41 dq40 dq37 dq38 n p dq60 dq59 dq53 dq52 vss vss dq75 dq74 dq69 dq68 vcc vcc dq43 dq42 dq36 dq35 p r dq62 dq61 dq51 dq50 vcc vcc dq77 dq76 dq67 dq66 vss vss dq45 dq44 dq34 dq33 r t vss dq63 dq49 dq48 vccq vccq dq79 dq78 dq65 dq64 vss vss dq47 dq46 dq32 vcc t 123456789101112131415 ground array power d/q power address data io level ref. cntrl address-dnu unpopulated nc i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 3 austin semiconductor, inc. bga location s symbol type descriptio n l6 odt cntl input on-die-termination: registered high enables on data bus termination f4, f16,f13, f2, g5, ckx, ckx\ cntl input differential input clocks, one set for each x16bits g15, k12, m8, n6 g4, g16, k13, m6, k2 ckex cntl input clock enable which activates all on silicon clocking circuitry g1, g13, k16, k4, m12 csx\ cntl input chip selects, one for each 16 bits of the data bus width f12, g2, k15, l5, m11 rasx\ cntl input command input which along with cas\, we\ and cs\ define operations f1, g12, k4, l16, l4, casx\ cntl input command input which along with ras\, we\ and cs\ define operations f2, f13, l15, m4, m10 wex\ cntl input command input which along with ras\, cas\ and cs\ define operations e4, f15, m13, m7, m2 udmx cntl input one data mask cntl. for each upper 8 bits of a x16 word e2, e13, m15, m5, n11 ldmx cntl input one data mask cntl. for each lower 8 bits of a x16 word e5, e7, e11, n12, n5 udqsx cntl input data strobe input for upper byte of each x16 word f6, f8, f10, k6, l11 udqsx\ cntl input differential input of udqsx, only used when differential dqs mode is enabled e6, e10, f5, k5, l12 ldqsx cntl input data strobe input for lower byte of each x16 word f7, f11, g6, l7, l10 ldqsx\ cntl input differential input of ldqsx, only used when differential dqs mode is enabled a7, a8, a9, a10, b7, ax input array address inputs providing row addresses for active commands, and b8, b9, b10, c7, c8, the column address and auto precharge bit (a10) for read/write commands c9, c10, d 7 d8, d9, d10 dnu future input e8, e9 ba0, ba1 input bank address inputs a2, a3, a4, a13, a14, dqx input/output data bidirectional input/output pins a15, b1, b2, b3, b4, b13, b14, b15, b16, c1, c2, c3, c4, c13, c14, c15, c16, d1, d2, d3, d4, d13, d14, d15, d16, e1, e16, m1, m16, n1, n2, n3, n4, n7, n8, n9, n10, n13, n14, n15, n16, pp1, p2, p3, p4, p7, p8, p9, p10, p13, p14, p15, p16, r1, r2, r3, r4, r7, r8, r9, r10, r13, r14, r15, r16, t2, t3, t4, t7, t8, t9, t10, t13, t14, t15 e12 vref supply sstl_18 voltage reference b11, b12, c5, c6,e3, vcc supply core power supply f3, g3, h3, h12, h16, j3, j12, j16, k3, l3, m3, p11, p12, r5, r6, t16 a11, a12, d5, d6, h4, vccq supply i/o power h15, j4, j15, t5, t6 a5, a6, a16, b5, b6, vss supply core ground return c11, c12, d11, d12, e14, f14, g14, h1, h2, h14, j1, j2, j5, j13, j14, k14, l14, m14, p5, p6, r11, r12, t1, t11, t12 g7, g8, g9, g10, h7, vssq supply i/o ground return h8, h9, h10, j7, j8, j9, j10, k7, k8, k9, k10 e15, f9, g11, h6, h11, nc no connection j6, j11, k11, l1, l8, l9, a1 unpopulated unpopulated ball matrix location (location registration aid) i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 4 austin semiconductor, inc. description the 2.4gb ddr2 sdram, a high-speed cmos, dynamic random-access memory containing 2,684,354,560 bits. each of the five chips in the mcp are internally configured as 4-bank dram. the block diagram of the device is shown in figure 2. ball assignments and are shown in figure 3. the 2.4gb ddr2 sdram uses a double-data-rate architecture to achieve high-speed operation. the double data rate architecture is essentially a 4 n -prefetch architecture, with an interface designed to transfer two data words per clock cycle at the i/o balls. a single read or write access for the x72 ddr2 sdram effectively consists of a single 4 n -bit-wide, one-clock-cycle data transfer at the internal dram core and four corresponding n -bit-wide, one-half-clock-cycle data transfers at the i/o balls. a bidirectional data strobe (dqs, dqs#) is transmitted externally, along with data, for use in data capture at the receiver. dqs is a strobe transmitted by the ddr2 sdram during reads and by the memory controller during writes. dqs is edge-aligned with data for reads and center-aligned with data for writes. there are strobes, one for the lower byte (ldqs, ldqs#) and one for the upper byte (udqs, udqs#). the mcp ddr2 sdram operates from a differential clock (ck and ck#); the crossing of ck going high and ck# going low will be referred to as the positive edge of ck. commands (address and control signals) are registered at every positive edge of ck. input data is registered on both edges of dqs, and output data is referenced to both edges of dqs, as well as to both edges of ck. read and write accesses to the ddr2 sdram are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. accesses begin with the registration of an active command, which is then followed by a read or write command. the address bits registered coincident with the active command are used to select the bank and row to be accessed. the address bits registered coincident with the read or write command are used to select the bank and the starting column location for the burst access. the ddr2 sdram provides for programmable read or write burst lengths of four or eight locations. ddr2 sdram supports interrupting a burst read of eight with another read, or a burst write of eight with another write. an auto precharge function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst access. as with standard ddr sdrams, the pipelined, multibank architecture of ddr2 sdrams allows for concurrent operation, thereby providing high, effective bandwidth by hiding row precharge and activation time. a self refresh mode is provided, along with a power-saving power-down mode. all inputs are compatible with the jedec standard for sstl_18. all full drive-strength outputs are sstl_18- compatible. general notes ? the functionality and the timing specifications discussed in this data sheet are for the dllenabled mode of operation. ? throughout the data sheet, the various figures and text refer to dqs as ?dq.? the dq term is to be interpreted as any and all dq collectively, unless specifically stated otherwise. additionally, each chip is divided into 2 bytes, the lower byte and upper byte. for the lower byte (dq0cdq7), dm refers to ldm and dqs refers to ldqs. for the upper byte (dq8cdq15), dm refers to udm and dqs refers to udqs. ? complete functionality is described throughout the document and any page or diagram may have been simplified to convey a topic and may not be inclusive of all requirements. ? any specific requirement takes precedence over a general statement. initialization ddr2 sdrams must be powered up and initialized in a predefined manner. operational procedures other than those specified may result in undefined operation. the following sequence is required for power up and initialization and is shown in figure 4 on page 8. 1. applying power; if cke is maintained below 0.2 x v ccq , outputs remain disabled. to guarantee r tt (odt resistance) is off, v ref must be valid and a low level must be applied to the odt ball (all other inputs may be undefined, i/os and outputs must be less than v ccq during voltage ramp time to avoid ddr2 sdram device latch-up). at least one of the i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 5 austin semiconductor, inc. following two sets of conditions (a or b) must be met to obtain a stable supply state (stable supply defi ned as v cc , v ccq , v ref , and v tt are between their minimum and maximum values as stated in table20); a. (single power source) the v cc voltage ramp from 300mv to v cc (min) must take no longer than 200ms; during the v cc voltage ramp, |vcc - vccq| 0.3v. once supply voltage ramping is complete (when v ccq crosses v cc (min)), table 20 specifications apply. ?v cc , v ccq are driven from a single power converter output ?v tt is limited to 0.95v max ?v ref tracks v ccq/2 ; v ref must be within 0.3v with respect to v ccq/2 during supply ramp time ?v ccq > v ref at all times b. (multiple power sources) v cc > v ccq must be maintained during supply voltage ramping, for both ac and dc levels, until supply voltage ramping completes (v ccq crosses v cc [min]). once supply voltage ramping is complete, table 20 specifications apply. ? apply v cc before or at the same time as v ccq ; v cc voltage ramp time must be < 200ms from when v cc ramps from 300mv to v cc (min) ? apply v ccq before or at the same time as v tt ; the v ccq voltage ramp time from when v cc (min) is achieved to when v ccq (min) is achieved must be <500ms; while v cc is ramping, current can be supplied from v cc through the device to v ccq ? vref must track vccq/2, vref must be within 0.3v with respect to v ccq/2 during supply ramp time; v ccq > v ref must be met at all times ? apply v tt ; the v tt voltage ramp time from when v ccq (min) is achieved to when v tt (min) is achieved must be no greater than 500ms 2. for a minimum of 200 s after stable power nd clock (ck, ck#), apply nop or deselect commands and take cke high. 3. wait a minimum of 400ns, then issue a precharge all command. 4. issue an load mode command to the emr(2). (to issue an emr(2) command, provide low to ba0, provide high to ba1.) 5. issue a load mode command to the emr(3). (to issue an emr(3) command, provide high to ba0 and ba1.) 6. issue an load mode command to the emr to enable dll. to issue a dll enable command, provide low to ba1 and a0, provide high to ba0. bits e7, e8, and e9 can be set to ?0? or ?1?; micron recommends setting them to ?0?. 7. issue a load mode command for dll reset. 200 cycles of clock input is required to lock the dll. (to issue a dll reset, provide high to a8 and provide low to ba1, and ba0.) cke must be high the entire time. 8. issue precharge all command. 9. issue two or more refresh commands, followed by a dummy write. i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 6 austin semiconductor, inc. 8 t 1 r v da be l ( k c, ) ) ( i hg h 7 7 i hg h 9 ck t v 1 v v q c 2 c t t v 7 i ) n i m ( f l 3 i 5 i t tg 0 j t 0 i t 0 o / i oc t l f 0 l t ) 2 ( ) 3 ( t 1 t tc t 0 8 d i 3 d i i c b n i i t c e l a i oc t i l i 3 c c 1 c c c c c t t t t t t t t c w k c = t m a h gz = t tb 0 w r w r m w r m w r d 0 r r m = w m w r d a n 4 o o = o o o m m m m m m - - h z - m d z - m o o d m e e d m t m e m e s e m e e d o e d o v lc co lc c# k f rc n id f rc s o m l e v e l w o l d t v e k t t : p u r e o p n a c c t s # k n i m s 0 0 2 s q d s s e r d d a c l t t f e r c c d n a p o n e r p 0 t 0 a t t n e r c l c k c c t d o q d s n 0 0 4 0 0 2 c y c o s e c k h t m e e l b a n e l l d h t t e s e r l l d m l e r p m l f e r f e r m l 0 h t t e s e r l l d h t u a 0 1 0 k t 0 f t 0 e t d r m l m l 0 1 a a p r d 0 8 1 _ l t s s l e v e l o l l a v l a v a s e t a k a e r m l h t x e 1 1 m l m r o n o t a r e p o e t o n e e s e e s e t o n e d e d 0 1 a e d e d e d d r d r d r d r a p r d r d r figure 4 - power-up and initialization notes appear on page 7 i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 7 austin semiconductor, inc. notes: 1. applying power; if cke is maintained below 0.2 x v ccq , outputs remain disabled. to guarantee r tt (odt resistance) is off, vref must be valid and a low level must be applied to the odt ball (all other inputs may be undefined, i/os and outputs must be less than v ccq during voltage ramp time to avoid ddr2 sdram device latch-up). at least one of the following two sets of conditions (a or b) must be met to obtain a stable supply state (stable supply defined as v cc , v ccq ,v ref , and v tt are between their minimum and maximum values as stated in dc operating conditions table): a. (single power source) the v cc voltage ramp from 300mv to v cc (min) must take no longer than 200ms; during the v cc voltage ramp, |v cc - v ccq | < 0.3v. once supply voltage ramping is complete (when v ccq crosses v cc (min), dc operating conditions table specifications apply. ? v cc , v ccq are driven from a single power converter output ? v tt is limited to 0.95v max ? v ref tracks v ccq/2 ; v ref must be within 3v with respect to v ccq/2 during supply ramp time. ? v ccq > v ref at all times b. (multiple power sources) v cc e? v ccq must be maintained during supply voltage ramping, for both ac and dc levels, until supply voltage ramping completes (v ccq crosses v cc [min]). once supply voltage ramping is complete, dc operating conditions table specifications apply. ? apply v cc before or at the same time as v ccq ; v cc voltage ramp time must be < 200ms from when v cc ramps from 300mv to v cc (min) ? apply v ccq before or at the same time as v tt ; the v ccq voltage ramp time from when v cc (min) is achieved to when v ccq (min) is achieved must be < 500ms; while v cc is ramping, current can be supplied from v cc through the device to v ccq ? v ref must track v ccq/2 , v ref must be within 0.3v with respect to v ccq/2 during supply ramp time; v ccq > v ref must be met at all times ? apply v tt ; the v tt voltage ramp time from when v ccq (min) is achieved to when vtt (min) is achieved must be no greater than 500ms 2. for a minimum of 200 s after stable power and clock (ck, ck#), apply nop or deselect commands and take cke high. 3. wait a minimum of 400ns, then issue a precharge all command/ 4. issue an load mode command to the emr(2). (to issue an emr(2) command, provide low to ba0, provide high to ba1.) 5. issue a load mode command to the emr(3). (to issue an emr(3) command, provide high to ba0 and ba1.) 6. issue an load mode command to the emr to enable dll. to issue a dll enable command, provide low to ba1 and a0, provide high to ba0. bits e7, e8, and e9 can be set to ?0? or ?1?; micron recommends setting them to ?0.? 7. issue a load mode command for dll reset. 200 cycles of clock input is required to lock the dll. (to issue a dll reset, provide high to a8 and provide low to ba1, and ba0.) cke must be high the entire time. 8. issue precharge all command. 9. issue two or more refresh commands, followed by a dummy write. 10. issue a load mode command with low to a8 to initialize device operation (i.e., to program operating parameters without resetting the dll). 11. issue a load mode command to the emr to enable ocd default by setting bits e7, e8, and e9 to ?1,? and then setting all other desired parameters. 12. issue a load mode command to the emr to enable ocd exit by setting bits e7, e8, and e9 to ?0,? and then setting all other desired parameters. 13. issue a load mode command with low to a8 to initialize device operation (i.e., to program operating parameters without resetting the dll). 14. issue a load mode command to the emr to enable ocd default by setting bits e7,e8, and e9 to ?1,? and then setting all other desired parameters. 15. issue a load mode command to the emr to enable ocd exit by setting bits e7, e8, and e9 to ?0,? and then setting all other desired parameters. the ddr2 sdram is now initialized and ready for normal operation 200 clocks after dll reset (in step 7). i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 8 austin semiconductor, inc. mode register (mr) the mode register is used to define the specific mode of operation of the ddr2 sdram. this definition includes the selection of a burst length, burst type, cl, operating mode, dll reset, write recovery, and power-down mode, as shown in figure 5. contents of the mode register can be altered by re-executing the load mode (lm) command. if the user chooses to modify only a subset of the mr variables, all variables (m0?m14) must be programmed when the command is issued. the mode register is programmed via the lm command (bits ba1?ba0 = 0, 0) and other bits (m12?m0) will retain the stored information until it is programmed again or the device loses power (except for bit m8, which is selfclearing). reprogramming the mode register will not alter the contents of the memory array, provided it is performed correctly. the lm command can only be issued (or reissued) when all banks are in the precharged state (idle state) and no bursts are in progress. the controller must wait the specified time t mrd before initiating any subsequent operations such as an active command. violating either of these requirements will result in unspecified operation. burst length burst length is defined by bits m0?m3, as shown in figure 5. read and write accesses to the ddr2 sdram are burst- oriented, with the burst length being programmable to either four or eight. the burst length dete rmines the maximum number of column locations that can be accessed for a given read or write command. when a read or write command is issued, a block of columns equal to the burst length is effectively selected. all accesses for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. the block is uniquely selected by a2?ai when bl = 4 and by a3?ai when bl = 8 (where ai is the most significant column address bit for a given configuration). the remaining (least significant) address bit(s) is (are) used to select the starting location within the block. the programmed burst length applies to both read and write bursts. figure 5 ? mode register (mr) definition burst type accesses within a given burst may be programmed to be either sequential or interleaved. the burst type is selected via bit m3, as shown in figure 5. the ordering of accesses within a burst is determined by the burst length, the burst type, and the starting column address, as shown in table 2. ddr2 sdram supports 4-bit burst mode and 8-bit burst mode only. for 8-bit burst mode, full interleave address ordering is supported; however, sequential address ordering is nibble-based. burst length pd a9 a7 a6 a5 a4 a3 a8 a2 a1 a0 mode register (mx) address bus 9 7 6 5 4 3 8 2 1 0 a10 a12 a11 10 11 12 13 0 1 14 reserved reserved 4 8 reserved reserved reserved reserved m0 0 1 0 1 0 1 0 1 m1 0 0 1 1 0 0 1 1 m2 0 0 0 0 1 1 1 1 0 1 interleaved m3 reserved reserved reserved 3 4 5 6 reserved m4 0 1 0 1 0 1 0 1 m5 0 0 1 1 0 0 1 1 m6 0 0 0 0 1 1 1 1 0 1 normal m7 15 0 1 no m8 reserved 2 3 4 5 6 reserved reserved m9 0 1 0 1 0 1 0 1 m10 0 0 1 1 0 0 1 1 m11 0 0 0 0 1 1 1 1 wr a13 mr 0 1 0 1 mode register (mr) extended mode register (emr) extended mode register (emr2) extended mode register (emr3) m15 0 0 1 1 0 1 fast exit (normal) (low power) m12 m14 note: 1. not used on this part slow exit cas# latency bt ba0 ba1 burst length burst type sequential cas laten cy (cl) mo de test dll tm dll reset yes write recovery mo de register definition pd mode i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 9 austin semiconductor, inc. notes: 1. for a burst length of two, a1-ai select two-data-element block; a0 selects the starting column within the block. 2. for a burst length of four, a2-ai select four-data-element block; a0-1 select the starting column within the block. 3. for a burst length of eight, a3-ai select eight-data-element block; a0-2 select the starting column within the block. 4. whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block. table 2 - burst definition operating mode the normal operating mode is selected by issuing a command with bit m7 set to ?0,? and all other bits set to the desired values, as shown in figure 5. when bit m7 is ?1,? no other bits of the mode register are programmed. programming bit m7 to ?1? places the ddr2 sdram into a test mode that is only used by the manufacturer and should not be used. no operation or functionality is guaranteed if m7 bit is ?1.? type = sequential type = interleaved a1 a0 0 0 0-1-2-3 0-1-2-3 0 1 1-2-3-0 1-0-3-2 1 0 2-3-0-1 2-3-0-1 1 1 3-0-1-2 3-2-1-0 a2 a1 a0 0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7 0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6 0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5 0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4 1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3 1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2 1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1 1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0 order of accesses within a burst 4 8 burst length starting column address dll reset dll reset is defined by bit m8, as shown in figure 5. programming bit m8 to ?1? will activate the dll reset function. bit m8 is self-clearing, meaning it returns back to a value of ?0? after the dll reset function has been issued. anytime the dll reset function is used, 200 clock cycles must occur before a read command can be issued to allow time for the internal clock to be synchronized with the external clock. failing to wait for synchronization to occur may result in a violation of the t ac or t dqsck parameters. write recovery write recovery (wr) time is defined by bits m9-m11, as shown in figure 5. the wr register is used by the ddr2 sdram during write with auto precharge operation. during write with auto precharge operation, the ddr2 sdram delays the internal auto precharge operation by wr clocks (programmed in bits m9-m11) from the last data burst. wr values of 2, 3, 4, 5, or 6 clocks may be used for programming bits m9-m11. the user is required to program the value of wr, which is calculated by dividing t wr (in ns) by t ck (in ns) and rounding up a non integer value to the next integer; wr [cycles] = t wr [ns] / t ck [ns]. reserved states should not be used as unknown operation or incompatibility with future versions may result. power-down mode active power-down (pd) mode is defined by bit m12, as shown in figure 5. pd mode allows the user to determine the active power-down mode, which determines performance versus power savings. pd mode bit m12 does not apply to precharge pd mode. when bit m12 = 0, standard active pd mode or ?fast-exit? active pd mode is enabled. the t xard parameter is used for fast-exit active pd exit timing. the dll is expected to be enabled and running during this mode. when bit m12 = 1, a lower-power active pd mode or ?slowexit? active pd mode is enabled. the t xard parameter is used for slow-exit active pd exit timing. the dll can be enabled, but ?frozen? during active pd mode since the exit-to-read command timing is relaxed. the power difference expected between pd normal and pd low-power mode is defined in the i cc table. i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 10 austin semiconductor, inc. cas latency (cl) the cas latency (cl) is defined by bits m4-m6, as shown in figure 5. cl is the delay, in clock cycles, between the registration of a read command and the availability of the first bit of output data. the cl can be set to 3, 4, 5, or 6 clocks, depending on the speed grade option being used. ddr2 sdram does not support any half-clock latencies. reserved states should not be used as unknown operation or incompatibility with future versions may result. ddr2 sdram also supports a feature called posted cas additive latency (al). this feature allows the read command to be issued prior to t rcd (min) by delaying the internal command to the ddr2 sdram by al clocks. examples of cl = 3 and cl = 4 are shown in figure 6; both assume al = 0. if a read command is registered at clock edge n , and the cl is m clocks, the data will be available nominally coincident with clock edge n + m (this assumes al = 0). figure 6 - cas latency (cl) t0 t1 t2 t3 t4 t5 t6 ck# ck command dqs, dqs# dq ck# ck command dqs, dqs# dq burst length = 4 posted cas# additive latency (al) = 0 shown with nominal t ac, t dqsck, and t dqsq d out n + 3 d out n + 2 d out n + 1 cl = 3 (al = 0) read nop nop nop d out n nop nop nop d out n + 3 d out n + 2 d out n + 1 cl = 4 (al = 0) read t0 t1 t2 nop nop nop d out n t3 t4 t5 nop nop t6 nop transitioning data dont care i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 11 austin semiconductor, inc. figure 7 ? extended mode register definition extended mode register (emr) the extended mode register controls functions beyond those controlled by the mode register; these additional functions are dll enable/disable, output drive strength, on die termination (odt) (rtt), posted al, off-chip driver impedance calibration (ocd), dqs# enable/disable, rdqs/rdqs# enable/disable, and output disable/enable. these functions are controlled via the bits shown in figure 7. the emr is programmed via the load mode (lm) command and will retain the stored information until it is programmed again or the device loses power. reprogramming the emr will not alter the contents of the memory array, provided it is performed correctly. the emr must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the specified time t mrd before initiating any subsequent operation. violating either of these requirements could esult in unspecified operation. dll out a9 a7 a6 a5 a4 a3 a8 a2 a1 a0 extended mode register (ex) address bus 9 7 6 5 4 3 8 2 1 0 a10 a12 a11 10 11 12 13 0 2 14 i 0 1 2 3 4 reserved reserved reserved e3 0 1 0 1 0 1 0 1 e4 0 0 1 1 0 0 1 1 e5 0 0 0 0 1 1 1 1 0 1 enable (normal) e0 15 0 1 le no e11 ocd program a13 ods rtt 0 1 le enable disable e10 rtt (nominal) rtt disabled 75? 150? 50? e2 0 1 0 1 e6 0 0 1 1 0 1 outputs enabled disabled e12 0 1 0 1 ) ) ) ) e15 0 0 1 1 e14 mrs ocd operation 1 reserved reserved reserved ocd default state 1 e7 0 1 0 0 1 e8 0 0 1 0 1 e9 0 0 0 1 1 0 1 output drive e1 note: 1. during initialization, all three bits must be set to "1" for ocd default state, initialization procedure. 2.. e13 (a13) is not used on this device. then must be set to "0" before initialization is ?nished, as detailed in the posted cas# rtt ba0 ba1 poste d cas# add tive laten cy (al) dll enable disable (test/debug) rdqs enab yes dqs# dqs# enab rdqs mo de register set mode register set (mr s extended mode register (emr s extended mode register (emr s2 extended mode register (emr s3 ocd not supported strength full strength (18 ? target) reduced strength (40 ? target) i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 12 austin semiconductor, inc. dll enable/disable the dll may be enabled or disabled by programming bit e0 during the lm command, as shown in figure 7. the dll must be enabled for normal operation. dll enable is required during power-up initialization and upon returning to normal operation after having disabled the dll for the purpose of debugging or evaluation. enabling the dll should always be followed by resetting the dll using an lm command. the dll is automatically disabled when entering self refresh operation and is automatically re-enabled and reset upon exit of self refresh operation. any time the dll is enabled (and subsequently reset), 200 clock cycles must occur before a read command can be issued, to allow time for the internal clock to synchronize with the external clock. failing to wait for synchronization to occur may result in a violation of the t ac or t dqsck parameters. output drive strength the output drive strength is defined by bit e1, as shown in figure 7. the normal drive strength for all outputs are specified to be sstl_18. programming bit e1 = 0 selects normal (full strength) drive strength for all outputs. selecting a reduced drive strength option (e1 = 1) will reduce all outputs to approximately 60 percent of the sstl_18 drive strength. this option is intended for the support of lighter load and/or point-to-point environments. dqs# enable/disable the dqs# ball is enabled by bit e10. when e10 = 0, dqs# is the complement of the differential data strobe pair dqs/ dqs#. when disabled (e10 = 1), dqs is used in a single ended mode and the dqs# ball is disabled. when disabled, dqs# should be left floating. this function is also used to enable/disable rdqs#. if rdqs is enabled (e11 = 1) and dqs# is enabled (e10 = 0), then both dqs# and rdqs# will be enabled. output enable/disable the output enable function is defined by bit e12, as shown in figure 7. when enabled (e12 = 0), all outputs (dqs, dqs, dqs#, rdqs, rdqs#) function normally. when disabled (e12 = 1), all ddr2 sdram outputs (dqs, dqs, dqs#, rdqs, rdqs#) are disabled, thus removing output buffer current. the output disable feature is intended to be used during i cc characterization of read current. on-die termination (odt) odt effective resistance, r tt (eff), is defined by bits e2 and e6 of the emr, as shown in figure 7. the odt feature is designed to improve signal integrity of the memory channel by allowing the ddr2 sdram controller to independently turn on/off odt for any or all devices. r tt effective resistance values of 50 ? , 75 ? , and 150 ? are selectable and apply to each dq, dqs/dqs#, rdqs/ rdqs#, udqs/udqs#, ldqs/ ldqs#, dm, and udm/ ldm signals. bits (e6, e2) determine what odt resistance is enabled by turning on/off ?sw1,? ?sw2,? or ?sw3.? the odt effective resistance value is elected by enabling switch ?sw1,? which enables all r1 values that are 150 ? each, enabling an effective resistance of 75 ? (r tt2 (eff) = r2/2). similarly, if ?sw2? is enabled, all r2 values that are 300 ? each, enable an effective odt resistance of 150 ? (r tt2 (eff) = r2/2). switch ?sw3? enables r1 values of 100 ? enabling effective resistance of 50 ? reserved states should not be used, as unknown operation or incompatibility with future versions may result. the odt control ball is used to determine when r tt (eff) is turned on and off, assuming odt has been enabled via bits e2 and e6 of the emr. the odt feature and odt input ball are only used during active, active power-down (both fast-exit and slow-exit modes), and precharge powerdown modes of operation. odt must be turned off prior to entering self refresh. during power-up and initialization of the ddr2 sdram, odt should be disabled until issuing the emr command to enable the odt feature, at which point the odt ball will determine the r tt (eff) value. any time the emr enables the odt function, odt may not be driven high until eight clocks after the emr has been enabled. see ?odt timing? section for odt timing diagrams. i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 13 austin semiconductor, inc. posted cas additive latency (al) posted cas additive latency (al) is supported to make the command and data bus efficient for sustainable bandwidths in ddr2 sdram. bits e3?e5 define the value of al, as shown in figure 7. bits e3?e5 allow the user to program the ddr2 sdram with an inverse al of 0, 1, 2, 3, or 4 clocks. reserved states should not be used as unknown operation or incompatibility with future versions may result. in this operation, the ddr2 sdram allows a read or write command to be issued prior to t rcd (min) with the requirement that al d? t rcd (min). a typical application using this feature would set al = t rcd (min) - 1x t ck. the read or write command is held for the time of the al before it is issued internally to the ddr2 sdram device. rl is controlled by the sum of al and cl; rl = al+cl. write latency (wl) is equal to rl minus one clock; wl = al + cl - 1 x t ck. figure 8 - extended mode register 2 (emr2) definition () ba0 ba1 a13 a12 a11 a10 a9 a8 a7 a 6 a5 a4 a3 a2 a1 a0 add ress bus ister (ex) 9 7 6 5 4 3 8 2 1 0 10 11 12 13 0 1 14 15 0 1 0 1 mode register definition 0 0 1 1 emr2 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 i use if t c e7 0 1 extended mo de reg mo de register (mr) extended mo de register (emr) extended mo de register (emr2) extended mo de register (emr3) m15 m14 high temperature self refresh rate enable commer c al-temperature default industrial-temperature option; exceeds 85c note: 1. e13 (a13)-e0(a0) are reserved for future use and must be programmed to "0." a13 is not used in this device. i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 14 austin semiconductor, inc. extended mode register 2 the extended mode register 2 (emr2) controls functions beyond those controlled by the mode register. currently all bits in emr2 are reserved, as shown in figure 8. the emr2 is programmed via the lm command and will retain the stored information until it is programmed again or the device loses power. reprogramming the emr will not alter the contents of the memory array, provided it is performed correctly. emr2 must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the specified time t mrd before initiating any subsequent operation. violating either of these requirements could result in unspecified operation. extended mode register 3 the extended mode register 3 (emr3) controls functions beyond those controlled by the mode register. currently, all bits in emr3 are reserved, as shown in figure 9. the emr3 is programmed via the lm command and will retain the stored information until it is programmed again or the device loses power. reprogramming the emr will not alter the contents of the memory array, provided it is performed correctly. emr3 must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the specifi ed time t mrd before initiating any subsequent operation. violating either of these requirements could result in unspecified operation. command truth tables the following tables provide a quick reference of ddr2 sdram available commands, including cke power-down modes, and bank-to-bank commands. figure 9 - extended mode register 3 (emr3) definition ba0 ba1 a13 a12 a11 a10 a9 a8 a7 a 6 a5 a4 a3 a2 a1 a0 add ress bus 9 7 6 5 4 3 8 2 1 0 10 11 12 13 14 15 emr3 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 0 1 extended mo de register (ex) 0 1 0 1 mode register definition 0 0 1 1 mo de register (mr) extended mo de register (emr) extended mo de register (emr2) extended mo de register (emr3) m15 m14 note: 1. e13 (a13)-e0 (a0) are reserved for future use and must be programmed to "0." a13 is not used in this device. i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 15 austin semiconductor, inc. ba0 a11 load mode h h llllba 2 refresh h h l l lhxxxx self-refresh entry h l l l lhxxxx hxxx lhhh single bank precharge hhllhlxxlx2 all banks precharge hhllhlxxhx bank activate hhllhlba write hhllhlba column address l column address 2,3 write with auto precharge hhlhllba column address h column address 2,3 read h h lhlhba column address l column address 2,3 read with auto precharge h h lhlhba column address l column address 2,3 no operation h x lhhhxxxx device deselect h x hxxxxxxx hxxx lhhh hxxx lhhh cke function cs# ras# cas# we# ba1 a12 a10 a9-a0 notes previous cycle current cycle power-down exit l h xxxx4 power-down entry h l xxxx4 7 self-refresh exit lh x op code row address xxx table 3 - truth table - ddr2 commands note: 1. all ddr2-sdram commands are defined by staes of cs#, ras#, cas#, we#, and cke a the rising edge of the clock. 2. bank addresses (ba) ba0-ba12 determine which bank is to be operated upon. ba during a lm command selects which mode register is programmed. 3. burst reads or writes at bl=4 cannot be terminated or interrupted. 4. the power down mode does not perform any refresh operations. the duration of power down is therefore limited by the refresh requirements outlined in the ac parametric section. 5. the state of odt does not effect the states described in this table. the odt function is not available during self refresh. see ?on die termination (odt)? for details. 6. ?x? means ?h or l? (but a defined logic level) 7. self refresh exit is asynchronous. i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 16 austin semiconductor, inc. deselect the deselect function (cs# high) prevents new commands from being executed by the ddr2 sdram. the ddr2 sdram is effectively deselected. operations already in progress are not affected. no operation (nop) the no operation (nop) command is used to instruct the selected ddr2 sdram to perform a nop (cs# is low; ras#, cas#, and we are high). this prevents unwanted commands from being registered during idle or wait states. operations already in progress are not affected. load mode (lm) the mode registers are loaded via inputs ba1?ba0, and a12?a0. ba1?ba0 determine which mode register will be programmed. see ?mode register (mr)?. the lm command can only be issued when all banks are idle, and a subsequent execute able command cannot be issued until t mrd is met. bank/row activation active command the active command is used to open (or activate) a row in a particular bank for a subsequent access. the value on the ba1?ba0 inputs selects the bank, and the address provided on inputs a12?a0 selects the row. this row remains active (or open) for accesses until a precharge command is issued to that bank. a precharge command must be issued before opening a different row in the same bank. active operation before any read or write commands can be issued to a bank within the ddr2 sdram, a row in that bank must be opened (activated), even when additive latency is used. this is accomplished via the active command, which selects both the bank and the row to be activated. after a row is opened with an active command, a read or write command may be issued to that row, subject to the t rcd specification. t rcd (min) should be divided by the clock period and rounded up to the next whole number to determine the earliest clock edge after the active command on which a read or write command can be entered. the same procedure is used to convert other specification limits from time units to clock cycles. for example, a t rcd (min) specification of 20ns with a 266 mhz clock ( t ck = 3.75ns) results in 5.3 clocks, rounded up to 6. a subsequent active command to a different row in the same bank can only be issued after the previous active row has been closed (precharged). the minimum time interval between successive active commands to the same bank is defined by t rc a subsequent active command to another bank can be issued while the first bank is being accessed, which results in a reduction of total row-access overhead. the minimum time interval between successive active commands to different banks is defined by t rrd. figure 10 - active command ck # ck ck e cs # ras# cas# we# address bank address row bank dont care i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 17 austin semiconductor, inc. read command the read command is used to initiate a burst read access to an active row. the value on the ba1?ba0 inputs selects the bank, and the address provided on inputs a0?i (where i = a9) selects the starting column location. the value on input a10 determines whether or not auto precharge is used. if auto precharge is selected, the row being accessed will be precharged at the end of the read burst; if auto precharge is not selected, the row will remain open for subsequent accesses. read operation read bursts are initiated with a read command. the starting column and bank addresses are provided with the read command and auto precharge is either enabled or disabled for that burst access. if auto precharge is enabled, the row being accessed is automatically precharged at the completion of the burst. if auto precharge is disabled, the row will be left open after the completion of the burst. during read bursts, the valid data-out element from the starting column address will be available read latency (rl) clocks later. rl is defined as the sum of al and cl; rl = al + cl. the value for al and cl are programmable via the mr and emr commands, respectively. each subsequent data- out element will be valid nominally at the next positive or negative clock edge (i.e., at the next crossing of ck and ck#). dqs/dqs# is driven by the ddr2 sdram along with output data. the initial low state on dqs and high state on dqs# is known as the read preamble ( t rpre). the low state on dqs and high state on dqs# coincident with the last data- out element is known as the read postamble ( t rpst). upon completion of a burst, assuming no other commands have been initiated, the dq will go high-z. data from any read burst may be concatenated with data from a subsequent read command to provide a continuous flow of data. the first data element from the new burst follows the last element of a completed burst. the new read command should be issued x cycles after the first read command, where x equals bl / 2 cycles. ck ras# we# address a bank address co l bank enable disable a10 ck # ck e cs # cas# uto pre charge dont care figure 11 - read command i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 18 austin semiconductor, inc. write command the write command is used to initiate a burst write access to an active row. the value on the ba1?ba0 inputs selects the bank, and the address provided on inputs a0?9 selects the starting column location. the value on input a10 determines whether or not auto precharge is used. if auto precharge is selected, the row being accessed will be precharged at the end of the write burst; if auto precharge is not selected, the row will remain open for subsequent accesses. input data appearing on the dq is written to the memory array subject to the dm input logic level appearing coincident with the data. if a given dm signal is registered low, the corresponding data will be written to memory; if the dm signal is registered high, the corresponding data inputs will be ignored, and a write will not be executed to that byte/column location. write operation write bursts are initiated with a write command, as shown in figure 12. ddr2 sdram uses wl equal to rl minus one clock cycle [wl = rl - 1ck = al + (cl - 1ck)]. the starting column and bank addresses are provided with the write command, and auto precharge is either enabled or disabled for that access. if auto precharge is enabled, the row being accessed is precharged at the completion of the burst. for the generic write commands used in the following illustrations, auto precharge is disabled. during write bursts, the first valid data-in element will be registered on the first rising edge of dqs following the write command, and subsequent data elements will be registered on successive edges of dqs. the low state on dqs between the write command and the first rising edge is known as the write preamble; the low state on dqs following the last data-in element is known as the write postamble. the time between the write command and the fi rst rising dqs edge is wl t dqss. subsequent dqs positive rising edges are timed, relative to the associated clock edge, as t dqss. t dqss is specified with a relatively wide range (25 percent of one clock cycle). all of the write diagrams show the nominal case, and where the two extreme cases ( t dqss [min] and t dqss [max]) might not be intuitive, they have also been included. upon completion of a burst, assuming no other commands have been initiated, the dq will remain high-z and any additional input data will be ignored. data for any write burst may be concatenated with a subsequent write command to provide continuous flow of input data. the fi rst data element from the new burst is applied after the last element of a completed burst. the new write command should be issued x cycles after the first write command, where x equals bl/2. ddr2 sdram supports concurrent auto precharge options, as shown in table 4. ddr2 sdram does not allow interrupting or truncating any write burst using bl = 4 operation. once the bl = 4 write command is registered, it must be allowed to complete the entire write burst cycle. however, a write (with auto precharge disabled) using bl = 8 operation might be interrupted and truncated only by another write burst as long as the interruption occurs on a 4-bit boundary, due to the 4 n prefetch architecture of ddr2 sdram. write burst bl = 8 operations may not to be interrupted or truncated with any command except another write command. data for any write burst may be followed by a subsequent read command. the number of clock cycles required to meet t wtr is either 2 or t wtr/ t ck, whichever is greater. data for any write burst may be followed by a subsequent precharge command. t wt starts at the end of the data burst, regardless of the data mask condition. i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 19 austin semiconductor, inc. figure 12 - write command ck ras# we# high address en ap ca a10 dis ap bank address ba note: ck # ck e cs # cas# dont care ca = column address; ba = bank address; en ap = enable auto precharge; and dis ap = disable auto precharge. table 4 - write using concurrent auto precharge read or read w/ ap (cl-1) + (bl/2) + t wtr t ck write or write w/ ap (bl/2) t ck precharge or active 1 t ck units from command (bank n ) write with auto precharge to command (bank m ) minimum delay (with concurrent auto precharge) i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 20 austin semiconductor, inc. precharge command the precharge command, illustrated in figure 13, is used to deactivate the open row in a particular bank or the open row in all banks. the bank(s) will be available for a subsequent row activation a specified time ( t rp) after the precharge command is issued, except in the case of concurrent auto precharge, where a read or write command to a different bank is allowed as long as it does not interrupt the data transfer in the current bank and does not violate any other timing parameters. once a bank has been precharged, it is in the idle state and must be activated prior to any read or write commands being issued to that bank. a precharge command is allowed if there is no open row in that bank (idle state) or if the previously open row is already in the process of precharging. however, the precharge period will be determined by the last precharge command issued to the bank. precharge operation input a10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs ba1?ba0 select the bank. otherwise ba1?ba0 are treated as ?don?t care.? when all banks are to be precharged, inputs ba1?ba0 are treated as ?don?t care.? once a bank has been precharged, it is in the idle state and must be activated prior to any read or write commands being issued to that bank. t rpa timing applies when the precharge (all) command is issued, regardless of the number of banks already open or closed. if a single-bank precharge command is issued, t rp timing applies. self refresh command the self refresh command can be used to retain data in the ddr2 sdram, even if the rest of the system is powered down. when in the self refresh mode, the ddr2 sdram retains data without external clocking. all power supply inputs (including v ref ) must be maintained at valid levels upon entry/exit and during self refresh operation. the self refresh command is initiated like a refresh command except cke is low. the dll is automatically disabled upon entering self refresh and is automatically enabled upon exiting self refresh (200 clock cycles must then occur before a read command can be figure 13 ? precharge command issued). the differential clock should remain stable and meet t cke specifications at least 1 x t ck after entering self refresh mode. all command and address input signals except cke are ?don?t care? during self refresh. the procedure for exiting self refresh requires a sequence of commands. first, the differential clock must be stable and meet t ck specifications at least 1 x t ck prior to cke going back high. once cke is high ( t cle(min) has been satisfied with four clock registrations), the ddr2 sdram must have nop or deselect commands issued for t xsnr because time is required for the completion of any internal refresh in progress. a simple algorithm for meeting both refresh and dll requirements is to apply nop or deselect commands for 200 clock cycles before applying any other command. note: self refresh not available at military temperature. ck# ck cke we# a10 ba one bank ba0, ba1 dont care note: cs# ras# cas# high address all banks ba = bank address (if a10 is low; otherwise "don't care"). i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 21 austin semiconductor, inc. parameter symbol units notes supply voltage v cc v1 i/o supply voltage v ccq v4 i/o reference voltage v ref v2 i/o termination voltage v tt v3 all voltages referenced to vss v ref v ref + 0.04 0.50 x v ccq 1.9 0.51 x v ccq 1.7 0.49 x v ccq v ref - 0.04 1.8 min typ max 1.7 1.8 1.9 dc operating conditions notes: 1. v cc v ccq must track each other. v ccq must be less than or equal to v cc . 2. v ref is expected to equal v ccq /2 of the transmitting device and to track variations in the dc level of the same. peak-to-peak noise on v ref may not exceed 1 percent of the dc value. peak-to-peak ac noise on v ref may not exceed 2 percent of v ref . this measurement is to be taken at the nearest v ref bypass capacitor. 3. v tt is not applied directly to the device. v tt is a system supply for signal termination resistors, is expected to be set equal to v ref and must track variations in the dc level of v ref . 4. v ccq tracks with v cc track with v cc . absolute maximum ratings min max unit -1.0 2.3 v -0.5 2.3 v -0.5 2.3 v -55.0 125.0 c -55.0 125.0 c -5 5 ua -18 18 ua symbol parameter v cc v ccq v in , v out t stg i qz devcie operating temperature t case cmd/adr, ras\, cas\ we\' cs\. cke ck, ck\ i vref i i input leakage current; any input 0v i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 23 austin semiconductor, inc. ddrii icc specifications and conditions parameter symbol units operating current: one bank active-precharge precharge power-down current precharge quiet standby current precharge standby current active power-down curren t active standby current operating burst write current operating burst read current burst refresh current self refresh current operating bank interleave read current: 15 ma 1600 1600 ma 1600 15 15 35 35 35 ma 970 750 ma 925 870 825 ma 300 245 ma 1250 1025 775 ma 620 all bank interleaving reads, iout = 0ma; bl=4, cl=cl(icc), al=trcd(icc)-1xtck(icc); tck=tck(icc), trc=trc(icc), trrd=trrd(icc); cke is high, cs\ is high between valid commands; address bus inputs are stable during deselects; data bus inputs are switching ck and ck\ at 0v; cke i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 24 austin semiconductor, inc. ac operating specifications -3 -38 -5 333mhz/667mbps 266mhz/567mbps 200mhz/400mbps parameter symbol min max min max min max units clock cycle time cl=5 tck avg 38 ns cl=4 tck avg 3.75 8 3.75 8 5 8 ns cl=3 tck avg 585858ns clock high time tch avg 0.48 0.52 0.48 0.52 0.48 0.52 tck clock low time tcl avg 0.48 0.52 0.48 0.52 0.48 0.52 tck half clock period min of thp tch,tcl tch,tcl tch,tcl ps clock jitter - period tjit per -125 125 -125 125 -125 125 ps clock jitter - half period tjit duty -125 125 -125 125 -150 150 ps clock jitter - cycle to cycle tjit cc ps cumulative jitter error, 2 cycles terr 2per -175 175 -175 175 -175 175 ps cumulative jitter error, 4 cycles terr 4per -250 250 -250 250 -250 250 ps cumulative jitter error, 6-10 cycles terr 10per -350 350 -350 350 -350 350 ps cumulative jitter error, 11-50 cycles terr 50per -450 450 -450 450 -450 450 ps dq hold skew factor tqhs - 340 - 400 - 450 ps dq output access time from ck/ck\ tac -450 450 -500 500 -600 600 ps data-out high-z window from ck/ck\ thz tac(max) tac(max) tac(max) ps dqs low-z window from cl/ck\ tlz 1 tac(min) tac(max) tac(min) tac(max) tac(min) tac(max) ps dq low-z window from ck/ck\ tlz 2 2*tac(min) tac(max) 2*tac(min) tac(max) 2*tac(min) tac(max) ps dq and dm input setup time relative to dqs tds jedec 100 100 150 ps dq and dm input hold time relative to dqs tds jedec 175 225 275 ps dq and dm input pulse width (for each input) tdipw 0.35 0.35 0.35 tck data hold skew factor tqhs 340 400 450 ps dq-dqs hold, dqs to first dq to go non valid, per access tqh thp-tqhs thp-tqhs thp-tqhs ps data valid output window (dvw) tdvw tqh-tdqsq tqh-tdqsq tqh-tdqsq ps dqs input-high pulse width tdqsh 0.35 0.35 0.35 tck dqs input-low pulse width tdqsl 0.35 0.35 0.35 tck dqs output access time from ck/ck\ tdqsck -400 400 -400 400 -450 450 ps dqs falling edge to ck rising - setup time tdss 0.2 0.2 0.2 tck dqs falling edge from ck rising-hold time tdsh 0.2 0.2 0.2 tck dqs-dq skew, dqs to last dq valid, per group, per access tdqsq 240 300 350 ps dqs read preamble trpre 0.9 1.1 0.9 1.1 0.9 1.1 tck dqs read postamble trpst 0.4 0.6 0.4 0.6 0.4 0.6 tck write preamble setup time twpres 0 0 0 ps dqs write preamble twpre 0.35 0.25 0.25 tck dqs write postamble twpst 0.4 0.6 0.4 0.6 0.4 0.6 tck positive dqs latching edge to associated clock edge tdqss -0.25 0.25 -0.25 0.25 -0.25 0.25 tck write command to first dqs latching transition wl-tdqss wl+tdqss wl-tdqss wl+tdqss wl-tdqss wl+tdqss tck 250 250 250 clock jitter data data strobe clock i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 25 austin semiconductor, inc. ac operating specifications (continued) -3 -38 -5 333mhz/667mbps 266mhz/567mbps 200mhz/400mbps parameter symbol min max min max min max units address and control input puslse width for each input tipw 0.6 0.6 0.6 tck address and control input setup time tis jedec 200 250 350 ps address and control input hold time tih jedec 275 375 475 ps cas\ to cas\ command delay tccd 2 2 2 ps active to active command (same bank) trc 55 55 55 ps active bank a to active bank b command trrd 10 10 10 tck active to read or write delay trcd 15 15 15 ns 4-bank activate period tfaw 50 50 50 ns active to precharge tras 40 70000 10 70000 40 70000 ns internal read to precharge command delay trtp 7.5 7.5 7.5 ns write recovery time twr 15 15 15 ns auto precharge write recovery+precharge time tdal twr + trp twr + trp twr + trp ns internal write to read command delay twtr 7.5 7.5 10 ns precharge command period trp 15 15 15 ns precharge all command period trpa trp+tcl trp+tcl trp+tcl ns load mode, command cycle time tmrd 2 2 2 tck cke low to ck, ck\ uncertainty tdelay ns refresh to active or refresh to refresh command interval average periodic refresh interval [industrial temp] trefi it 7.8 7.8 7.8 us average periodic refresh interval [enhanced temp] trefi et tbd 3.9 3.9 us average periodic refresh interval [extended temp] trefi xt tbd tbd 3.9 us exit self refresh to non read command exit self refresh to read command exit self refresh timing reference odt turn-on delay taond 222222tck odt turn-on delay taond tac(min) tac(max)+7 00 tac(min) tac(max)+1 000 tac(min) tac(max)+1 000 ps odt turn-off delay taopd 2.5 2.5 2.5 2.5 2.5 2.5 tck odt turn-off delay taof tac(min) tac(max)+6 00 tac(min) tac(max)+6 00 tac(min) tac(max)+6 00 ps odt turn-on (power-down mode) taonpd tac(min) + 2000 2 x tck + tac(max)+1 000 tac(min) + 2000 2 x tck + tac(max)+1 000 tac(min) + 2000 2 x tck + tac(max)+1 000 ps odt turn-off (power-down mode) taqfpd tac(min) + 2000 2.5 x tck + tac(max)+1 000 tac(min) + 2000 2.5 x tck + tac(max)+1 000 tac(min) + 2000 2.5 x tck + tac(max)+1 000 ps odt to power-down entry latency tanpd 3 3 3 tck odt power-down exit latency taxpd 8 8 8 tck odt enable from mrs command tmod 12 12 12 ns exit active power-down to read command, mr[12]=0 txard 2 2 2 tck exit active power-down to read command, mr[12]=1 tsards 7 - al 6 - al 6 - al tck exit precharge power-down to any non read txp 2 2 2 tck cke min. high/low time tcle 3 3 3 tck pwrdn 200 ns tck ps ns tis 200 200 tis tis trfc(min)+ 10 trfc(min)+ 10 tis + tcl + tih tis + tcl + tih 105 70000 105 70000 105 70000 refresh s. refresh odt tis + tcl + tih trfc txsnr txsrd tisxr trfc(min)+ 10 command and address i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 26 austin semiconductor, inc. mechanical diagram (bottom view) t r p n m l k j h g f e d c b a 1 234 5 6 7 8 9 10 11 12 13 14 15 16 2.03 max 0.61 nom 24.90 25.10 19.05 nom 1.27 1.27 nom nom 31.90 32.10 255 x 0.762 nom i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 27 austin semiconductor, inc. ordering information part numbe r a vailabilit y as4ddr232m72pbg-ms oct. 2006 as4ddr232m72pbg-e s nov. 2006 as4ddr232m72pbg-3/i t consult factory as4ddr232m72pbg-38/i t consult factory as4ddr232m72pbg-5/i t consult factory as4ddr232m72pbg-38/e t consult factory as4ddr232m72pbg-5/e t consult factory as4ddr232m72pbg-38/x t consult factory as4ddr232m72pbg-5/x t consult factory es = engineering sample = fuctional units with no speed rating above min operating frequency it = industrial = full production, industrial class integrated component, fully operable across -40c to +85c et = enhanced = full production, enhanced class integrated component, fully operable across -40c to +105c it = extended = full production, mil-temperature class integrated component, fully operable across -55c to +125c core freqency data rate device grade na na mechanical sample functional 333mhz 266mhz 200mhz 266mhz 200mhz 266mhz 200mhz 667mbps 567mbps 400mbps 567mbps 400mbps 567mbps 400mbps engineering sample industrial industrial industrial enhanced enhanced extended (mil-temp) extended (mil-temp) i i i i i pem pem pem pem pem 2.4 g 2.4 g 2.4 g 2.4 g 2.4 g b b b b b sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 sdram-ddr2 as4ddr232m72pbg as4ddr232m72pbg rev. 0.2 10/06 austin semiconductor, inc. austin, texas 512.339.1188 www.austinsemiconductor.com 28 austin semiconductor, inc. document title 2.4gb, 32m x 72, ddr2 sdram, 25mm x 32mm - 255 pbga multi-chip package [ipem] revision history rev # history release date status 0.0 initial release august 2006 advance 0.1 change (s) august 2006 advance all pages-header: change ddr to ddr2 pg. 1-add ddr2 to data rate feature spec. all pages-footer: update revision history table 0.2 change (s) october 2006 advance page 1: corrected part number error in feature list for total weight page 2: corrected typo in first paragraph page 3: pin definition, placement diagram label corrections revision page: correct datasheet level term from advanced to advance all pages: footer: update revision, date history |
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